Project Title:
Large-area SiC-on-insulator (SiCOI) Substrates for High-temperature Electronics
94-1 01.03 6000
Large-area SiC-on-insulator (SiCOI) Substrates for High-
temperature Electronics
Abstract:
This Phase I program will fabricate low-defect, high-quality SiC
(using carbonized ultrathin silicon-on-insulator (SOI) structures)
as a lattice-matched buffer layer for CVD growth of SiC device
structures. Recently, Spire demonstrated for the first time the
fabrication of ultrathin Si on SiO2 (140 A) by using the low-energy
Separation by IMplantation of OXygen (SIMOX) process. SiC thin
films will be fabricated by carbonizing the ultrathin Si top layer
of SIMOX wafers. The carbonization technique has produced the
lowest defect density in epitaxial SiC on Si; however, due to the
different lattice constants, a strained layer exists at the
interface which limits the usefulness of this material for device
applications.
Ultrathin Si films will allow rapid conversion of the entire Si
layer to SiC, since the SiC only contacts SiO2, which is amorphous
and softens at the carbonization temperature. In the absence of a
lattice mismatch, the source of stress is eliminated (as in SIMOX),
thus paving the way for formation of a high-quality SiC layer.
Phase I will produce SiC buffer layers under varying material and
processing conditions, and epitaxial SiC layers, by CVD, on the
lowest-defect material. Phase II would include optimization of the
processing parameters and fabrication of device structures for
material evaluation.
Fabrication of large-area, inexpensive, Si-based substrates for
growth of low-defect SiC and GaN films will enable for radiation-
hard, high-temperature electronics. These substrates are essential
for integration of LEDs, lasers, detectors, and a variety of other
devices into Si microelectronic chips.
silicon carbide (SiC), carbonization, gallium nitride (GaN), atomic
layer epitaxy (ALE), silicon-on-insulator (SOI)
Spire Corporation
One Patriots Park
Bedford, MA 01730-2396
Phone number: (617) 275-6000