Multispectral, Remote Sensing Using SPRITE Technology
Multispectral, Remote Sensing Using SPRITE
Photon Research Associates, Inc.
1033 Massachusetts Avenue
Cambridge, MA 02138
James C. Fraser
For continuous spatial and spectral analysis of optical radiation, a new concept
for a spectrometer that performs in either a serial-scan (pushbroom) or a staring
mode to detect infrared radiation will be evaluated. It applies a new detector device
known as a SPRITE (signal processing in the element), which offers increased integration
time, increased resolution, and reduced electronic processing over current area-array
spectrometer concepts. Developed for thermal imaging at 8 to 12 microns, SPRITE currently
uses mercury-cadmium-telluride photoconductive material. Optical compounding of HgCdTe
and alternative materials for implementing SPRITE technology may allow coverage of
the spectral regime from 1.1 to 14 microns. Phase I will analyze the essential solid-state
physics of the SPRITE detector, explore alternative SPRITE materials and spectral
bands, develop design concepts for a staring and scanning spectrometer, and predict
major performance characteristics such as bandwidth signal to noise, resolution,
and readout rates.
Potential Commercial Application:
Potential Commercial Applications: This concept would apply to an airborne or satellite-borne
pushbroom optical sensor and in a variety of passive and active optical sensing applications
including in-situ process monitoring of industrial chemical vapor processes.