NASA SBIR 2018-II Solicitation

Proposal Summary

 18-2- Z3.01-3442
 Advanced Metallic Materials and Processes Innovation
 In-Situ Fringe Pattern Profilometry for Feed-Forward Process Control
SMALL BUSINESS CONCERN (Firm Name, Mail Address, City/State/Zip, Phone)
Universal Technology Corporaration
1270 North Fairfield Road
Dayton, OH 45432
(937) 426-2808

PRINCIPAL INVESTIGATOR (Name, E-mail, Mail Address, City/State/Zip, Phone)
John Middendorf
2790-B Indian Ripple Road
Beavercreek, OH 45440 - 3639
(937) 306-6707

BUSINESS OFFICIAL (Name, E-mail, Mail Address, City/State/Zip, Phone)
Mr. Jason Sav
1270 North Fairfield Road
Dayton, OH 45432 - 2600
(937) 426-2808

Estimated Technology Readiness Level (TRL) :
Begin: 2
End: 4
Technical Abstract (Limit 2000 characters, approximately 200 words)

In Phase I the research team demonstrated a superior in situ profilometry sensor, based on fringe pattern projection, which quickly measures the whole build plate.  In this data, significant process phenomena are accurately measured and easily identified, such as spreading defects, rogue particles that have been sintered to the part’s surface, distortion, surface roughness variation, and virtually any geometric feature.  Of particular importance is the measurement of powder layer condensation and uniformity. This data serves as input to a model that generates feedforward information to adjust process parameters, resulting in better prediction and control of key material properties such as residual stress and density. 

In Phase II the team will further improve the sensor and test the feedforward model.  After fine-tuning the modelling capability for stress and distortion, mechanical testing will be conducted to validate model performance and determine the effect of defects (measured with the profilometry) on mechanical performance.  The result will be real-time determination of part quality by a modelling tool that integrates profilometry-detected defects into the performance predictions. This novel data will then be used to feed and validate a fast-feedback look-up table (generated by inverting the feedforward model), for layer-to-layer laser parameter adjustment during builds.  Next, a new design of the profilometry sensor will be completed to make it very compact (a few inches) so it can easily be added to OEM AM machines.    Then the research team will implement a new sensing technique (with the same hardware) to record video-rate, measurements, at nanometer precision, of thermal expansion and shrinking during the melting process, thereby facilitating novel and powerful analysis of residual stress and/or delamination formation.  Finally, the research team will demonstrate the whole sensor/modelling package on a NASA geometry of interest.

Potential NASA Applications (Limit 1500 characters, approximately 150 words)

Applications include any system that wishes to use AM parts in critical areas, including:

Rocket Engines: The SLS program heavily utilizes AM.  These components can be very large and require long build time, experiencing failed builds is painful.

Deep Space Exploration: Research on Stirling engines is heavily interested in AM and engine components must be reliable

Material development: High quality in situ data, like this profilometry, may be useful for investigating process phenomena during the development stages of new AM materials.

Potential Non-NASA Applications (Limit 1500 characters, approximately 150 words)

Applications include any system that wishes to use AM parts in critical areas, including:

Department of Defense supply chain: DoD suppliers aim to build an ever-growing list of critical parts that must have adequate process validation and documentation for the digital twin.

Medical Device:  AM is experiencing strong pull in medical devices.  Anything that goes in the human body must be qualified.

Duration: 24

Form Generated on 05/13/2019 13:34:14