NASA SBIR 2016 Solicitation


PROPOSAL NUMBER: 16-2 S2.04-7976
SUBTOPIC TITLE: X-Ray Mirror Systems Technology, Coating Technology for X-Ray-UV-OIR, and Free-Form Optics
PROPOSAL TITLE: Low Coherence Wavefront Probe for Nanometer Level Free-Form Metrology

SMALL BUSINESS CONCERN (Firm Name, Mail Address, City/State/Zip, Phone)
Apre Instruments, LLC
2440 West Ruthrauff Road, Suite 100
Tucson, AZ 85745 - 1950
(860) 398-5764

PRINCIPAL INVESTIGATOR/PROJECT MANAGER (Name, E-mail, Mail Address, City/State/Zip, Phone)
Artur Olszak
2440 West Ruthrauff Road, Suite 100
Tucson, AZ 85705 - 1950
(520) 639-8195

CORPORATE/BUSINESS OFFICIAL (Name, E-mail, Mail Address, City/State/Zip, Phone)
Robert Smythe
439 Higby Road
Middletown, CT 06457 - 2383
(860) 398-5764

Estimated Technology Readiness Level (TRL) at beginning and end of contract:
Begin: 4
End: 6

Technology Available (TAV) Subtopics
X-Ray Mirror Systems Technology, Coating Technology for X-Ray-UV-OIR, and Free-Form Optics is a Technology Available (TAV) subtopic that includes NASA Intellectual Property (IP). Do you plan to use the NASA IP under the award?

TECHNICAL ABSTRACT (Limit 2000 characters, approximately 200 words)
We propose an innovative, low coherence probe for rapid measurement of free-form optical surfaces based on a novel method of spectrally controlled interferometry. The key innovations are the use of a new interferometric modality and a novel non-contact optical probe that together measure high surface slope acceptance angles to nanometer sensitivity. When the probe is integrated with a precision motion, x, y, & z metrology frame, it will meet NASA's need to measure free-form optical surfaces from 0.5 cm to 6 cm diameter ranging from F/2 to F/20, including slopes up to 20 degrees (with potential for 60 degrees), with an uncertainty targeted at 2 nm RMS. The probe operation does not require tilting to measure slopes. This results in this simplified cartesian metrology frame, also critical to achieve 2 nanometer measurement uncertainty. These features: nanometer resolution and 20 degree slope acceptance angle, have up to this time not been found in a single probe or sensor, non-contact or contact. This Phase II proposal takes the probe and its innovative spectrally controlled light source into a production prototype level capable of meeting NASA metrology goals.

POTENTIAL NASA COMMERCIAL APPLICATIONS (Limit 1500 characters, approximately 150 words)
Free-form optics, both axially and non-axially symmetric, enable small and lightweight imaging and projection optical systems required by NASA. "Future NASA missions with alternative low-cost science and small-sized payloads are constrained by the traditional spherical form optics. These could benefit greatly by the free-form optics as they provide non-spherical optics with better aerodynamic characteristics for spacecraft with lightweight components to meet the mission requirements". This application aims to enable those optics to be manufactured to the required tolerances
to enable free-form optics to be used as envisioned. As of today there are no metrology tools available to meet the 2 nm RMS measurement uncertainty required to meet these mission requirements. Thus the primary road block to manufacturing high performance free form optics is metrology. The PROBE developed in the previous Phase I projects and to be implemented in this Phase II is a unique approach that combines non-contact interferometric sensitivity with high surface slope acceptance. Thus the accuracy, speed and data density required for free form optics will be achieved. This combination will enable optical manufacturers to meet NASA's need to acquire nanometer level free-form optics.

POTENTIAL NON-NASA COMMERCIAL APPLICATIONS (Limit 1500 characters, approximately 150 words)
The use of free-form optics in commercial applications is potentially massive, yet limited by the availability of high performance metrology. Cell phones, tablets, computers and remote mounted cameras utilize axially symmetric free-forms. Improved metrology means improved performance and higher manufacturing yields, and potentially lower manufacturing costs. Further, machine vision, security and defense related applications could benefit from free-form optics. New telescope designs at MIT Lincoln Laboratory promise wider fields of view with higher lateral resolution. Again metrology is lacking to produce these optics in the surface accuracy, data density and speed required to be commercially viable. Regarding illumination, higher efficiency lighting will bring more pleasant work environments and lower energy usage. Even for apparently mundane applications such as automotive headlamp lenses metrology is a limiting factor due to the extreme shapes. This technology promises to make free-form optics commercially viable.

TECHNOLOGY TAXONOMY MAPPING (NASA's technology taxonomy has been developed by the SBIR-STTR program to disseminate awareness of proposed and awarded R/R&D in the agency. It is a listing of over 100 technologies, sorted into broad categories, of interest to NASA.)
Detectors (see also Sensors)
Interferometric (see also Analysis)
Nondestructive Evaluation (NDE; NDT)
Optical/Photonic (see also Photonics)

Form Generated on 03-07-17 15:43