NASA STTR SUCCESS STORY Goddard Space Flight Center
SBIR 1996 Phase II

Portable, Hyperspectral Polarization Profiler For Remote Sensing of Vegetation

Containerless Research, Inc.

Evanston, IL

INNOVATION
NASA is tapping its expertise and unique remote sensing capabilities for a proof-of-concept demonstration of a simple and inexpensive nitrogen fertilizer control sensor, which may be critical in support of future NASA ground observation
The Hyperspectral Polarization Profiler (HYPOP)
The Hyperspectral Polarization Profiler (HYPOP)

 

ACCOMPLISHMENTS
  • Beginning in 1997 with NASA SBIR Phase I and II support, CRI delivered to NASA a polarization-sensing device to measure "ground truth" in support of space-based remote sensing
  • A simplified, low-cost two-wavelength device was then developed to establish a practical basis for nitrogen fertilizer sensing and control
  • Favorable economic impacts to farmers will result from the optimization of fertilizer use, maximizing crop growth while lowering costs
  • By reducing nitrogen usage, lower groundwater contamination will occur
COMMERCIALIZATION
  • A sensitive and inexpensive remote ground sensing device using CRI's novel plant species identification system may be vital for future NASA earth study programs
  • A NASA Illinois Commercialization Center (NICC) Award enabled CRI to define the requirements of the device through expertise provided by NASA
  • CRI has continued product development of a spectroscopic photo-polarimeter for application in environmental science, and a low-cost two-wavelength device to sense nitrogen fertilizer needs in agricultural fields
  • In-field measurements show applicability for real-time control of fertilizer application on corn fields
GOVERNMENT/SCIENCE APPLICATIONS
  • This project supports NASA's need for advanced space sensor research and other mapping applications
  • The depolarized reflectance spectra of plants are obtained with precision and sensitivity to plant species and growth factors that are not achieved by conventional reflectance measurements
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Manufacturing/Fabrication , Sensors


Curator: SBIR Support            2/28/06